IEEE AP-S Educational RF & Antenna Measurement and Characterization Kits
The IEEE Antennas and Propagation Society (AP-S) Nano-Instrumentation Program supports selected Chapters by providing portable, low-cost RF and antenna measurement tools to enhance hands-on education, chapter activities, and member engagement.
Through this program, Chapters may apply to receive:
nanoVNA kits, which enable RF network analysis and impedance/matching demonstrations, and/or
nanoFarField kits, which support fundamental antenna measurement and characterization without requiring access to large or expensive facilities.
Please use the following link to submit your request: